Thickness-dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/81259

Title:	Thickness-dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films
Authors:	Chia-Hsun Chen Pin-Hao Sher Cheng-Pin Chen Wing-Kit Choi Christopher J. Bardeen Tien-Lung Chiu Juen-Kai Wang Jiun-Haw Lee
Issue Date:	2020-11-09
Relation:	JOURNAL OF PHYSICAL CHEMISTRY C 124(47), 25729-25737
URI:	http://ir.sinica.edu.tw/handle/201000000A/81259
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1932-7447&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	https://pubs.acs.org/doi/abs/10.1021/acs.jpcc.0c07887
Appears in Collections:	原子與分子科學研究所

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