http://ir.sinica.edu.tw/handle/201000000A/73554
Title: | High-Sensitivity Imaging with Lateral Resonance Mode Atomic Force Microscopy | Authors: | Chih-Wen Yang Ren-Feng Ding Kuang-Yuh Huang Ing-Shouh Hwang |
Issue Date: | 2018-08-20 | Conference: | The 4th International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials (Leuven, Belgium : Royal Belgian Society for Microscopy (RBSM) The Katholieke Universiteit Leuven (KU Leuven) University of MONS (UMOS)) | URI: | http://ir.sinica.edu.tw/handle/201000000A/73554 |
Appears in Collections: | 物理研究所 |
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