http://ir.sinica.edu.tw/handle/201000000A/53838| Title: | In situ probing thickness dependence of the field effect mobility of naphthalenetetracarboxylic diimide-based field effect transistors | Authors: | Liu, Shun-Wei Lee, Chih-Chien Tai, Hung-Lin Wen, Je-Min Chen, C. -T. |
Issue Date: | 2010-08-01 | Conference: | 2010 SPIE Optics + Photonics (San Diego, California, USA : The International Society for Optical Engineering) | URI: | http://ir.sinica.edu.tw/handle/201000000A/53838 |
| Appears in Collections: | 化學研究所 |
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