http://ir.sinica.edu.tw/handle/201000000A/49141
DC Field | Value | Language |
---|---|---|
dc.contributor | 物理研究所 | - |
dc.contributor.author | C.L. Dong | - |
dc.contributor.author | K. Asokan | - |
dc.contributor.author | C.L. Chang | - |
dc.contributor.author | C.L. Chen | - |
dc.contributor.author | P.C. Lee | - |
dc.contributor.author | P.C. Chen | - |
dc.contributor.author | Y.Y. Chen | - |
dc.contributor.author | J.F. Lee | - |
dc.contributor.author | J.-H. Guo | - |
dc.date.accessioned | 2020-10-27T03:39:31Z | - |
dc.date.available | 2020-10-27T03:39:31Z | - |
dc.date.issued | 2006-03 | - |
dc.identifier.issn | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0368-2048&DestApp=JCR&RQ=IF_CAT_BOXPLOT | - |
dc.identifier.uri | http://ir.sinica.edu.tw/handle/201000000A/49141 | - |
dc.description.sponsorship | 物理研究所 | - |
dc.language.iso | en | - |
dc.relation.ispartof | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 152, 1-5 | - |
dc.title | Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy | - |
dc.type | journal article | - |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0368204806000053?np=y | - |
dc.description.note | 已出版;[SCI];有審查制度 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
item.languageiso639-1 | en | - |
item.grantfulltext | none | - |
Appears in Collections: | 物理研究所 |
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