Characterization of gasochromic Vanadium oxides films by x-ray absorption spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/48641

Title:	Characterization of gasochromic Vanadium oxides films by x-ray absorption spectroscopy
Authors:	Y. K. Ho C. C. Chang D. H. Wei C. L. Dong C. L. Chen J. L. Chen W. L. Jang C. C. Hsu T. S. Chan Krishna Kumar C. L. Chang M. K. Wu
Issue Date:	2013
Relation:	Thin Solid Films 544, 461-465
URI:	http://ir.sinica.edu.tw/handle/201000000A/48641
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0040-6090&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	物理研究所

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