Determining the Film Thickness and Probing the Interface Structure with Characteristic Scanning Tunneling Spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/48204

Title:	Determining the Film Thickness and Probing the Interface Structure with Characteristic Scanning Tunneling Spectroscopy
Authors:	Lu, S. M. Shih, H. T. Jiang, C. L. Su, W. B. Chang, C. S. Tsong, Tien T.
Issue Date:	2006-08-01
Relation:	Chinese Journal of Physics44(4), 309-315
URI:	http://ir.sinica.edu.tw/handle/201000000A/48204
Appears in Collections:	物理研究所

Show full item record

Check