http://ir.sinica.edu.tw/handle/201000000A/47558| Title: | Variation of electronic structures CeAl2 thin film with thickness studies by X-ray absorption near-edge structure spectroscopy | Authors: | Dong, C. L. Asokan, K. Chen, C. L. Chang, C. L. Lee, P. C. Chen, P. C. Chen, Y. Y. Lee, J. F. Guo, J. H. |
Issue Date: | 2006 | Relation: | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA第152卷，頁1-5 | URI: | http://ir.sinica.edu.tw/handle/201000000A/47558 |
| Appears in Collections: | 物理研究所 |
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