http://ir.sinica.edu.tw/handle/201000000A/47557
Title: | Electronic structure of CeAl2 thin films studies by X-ray absorption pectroscop |
Authors: | Dong, C. L. Chen, C. L. Chen, Y. Y. Asokan, K. Lee, J. F. Guo, J. -H. |
Issue Date: | 2006-01-01 |
Relation: | Applied surface Science第252卷第15期,頁5372-5375 |
URI: | http://ir.sinica.edu.tw/handle/201000000A/47557 |
Appears in Collections: | 物理研究所 |
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