Cross Section Measurements of High-p(t) Dilepton Final-State Processes Using a Global Fitting Method

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/47461

Title:	Cross Section Measurements of High-p(t) Dilepton Final-State Processes Using a Global Fitting Method
Authors:	Y. C. Chen S. M. Wang The CDF Collaboration
Issue Date:	2008-07-14
Relation:	PHYSICAL REVIEW D 78, 012003
URI:	http://ir.sinica.edu.tw/handle/201000000A/47461
Appears in Collections:	物理研究所

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