Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/47389

Title:	Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties
Authors:	Liao, H. -S. Juang, B. -J. Chang, W. -C. Lai, W. -C. Huang, K. -Y. Chang, C. -S.
Issue Date:	2011
Relation:	REVIEW OF SCIENTIFIC INSTRUMENTS82, 113710
URI:	http://ir.sinica.edu.tw/handle/201000000A/47389
Appears in Collections:	物理研究所

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