Easy method to adjust the angle of the carbon nanotube probe of an atomic force microscope

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/47355

Title:	Easy method to adjust the angle of the carbon nanotube probe of an atomic force microscope
Authors:	Chang, Y. C. Wang, D. C. Chang, C. S. Tsong, Tien T.
Issue Date:	2003-05-19
Relation:	APPLIED PHYSICS LETTERS82(20), 3541-3543
URI:	http://ir.sinica.edu.tw/handle/201000000A/47355
Appears in Collections:	物理研究所

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