Determination of domain walls resistance in a cobalt thin film by thickness modulation

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/46711

Title:	Determination of domain walls resistance in a cobalt thin film by thickness modulation
Authors:	Lee, Wei- Li Zhu, Frank Q. Chien, C. L.
Issue Date:	2006-03-01
Relation:	Applied Physics Letters88, 122503
URI:	http://ir.sinica.edu.tw/handle/201000000A/46711
Appears in Collections:	物理研究所

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