Identification of embedded charge defects in suspended silicon nanowires using a carbon-nanotube cantilever gate

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/46652

Title:	Identification of embedded charge defects in suspended silicon nanowires using a carbon-nanotube cantilever gate
Authors:	Lan, Yann-Wen Nguyen, Linh-Nam Lai, Shui-Jin Lin, Ming-Chou Kuan, Chieh-Hsiung Chen, Chii-Dong
Issue Date:	2011-08-01
Relation:	APPLIED PHYSICS LETTERS99, 053104
URI:	http://ir.sinica.edu.tw/handle/201000000A/46652
Appears in Collections:	物理研究所

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