http://ir.sinica.edu.tw/handle/201000000A/46365
Title: | Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement. | Authors: | Huang, S. Y. Liang, J. J. Hsu, S. Y. Lin, L. K. Tsai, T. C. Lee, S. F. |
Issue Date: | 2011-01-01 | Relation: | EUROPEAN PHYSICAL JOURNAL B79, 153-162 | URI: | http://ir.sinica.edu.tw/handle/201000000A/46365 |
Appears in Collections: | 物理研究所 |
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