Effect of the annealing temperature on the electronic and atomic structures of exchange-biased NiFe-FeMn bilayers

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/46171

Title:	Effect of the annealing temperature on the electronic and atomic structures of exchange-biased NiFe-FeMn bilayers
Authors:	Lee, J. . M. Jan, J. C. Chiou, J. W. Pong, W. F. Tsai, M. –H. Chang, Y. K. Chen, Y. Y. Wang, C. R. Lee, J. F. Yang, T. Lu, Z. Lai, W. Y. Mai, Z. H.
Issue Date:	2002
Relation:	Sur. Rev. and Lett9, 293-298
URI:	http://ir.sinica.edu.tw/handle/201000000A/46171
Appears in Collections:	物理研究所

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