Effects of an Os Buffer Layer on Structure and Exchange Bias Properties of CoFe/IrMn Fabricated on Si(100) and Si(111)

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/45854

Title:	Effects of an Os Buffer Layer on Structure and Exchange Bias Properties of CoFe/IrMn Fabricated on Si(100) and Si(111)
Authors:	Peng, Tai-Yen Lo, C. K. Chen, San-Yuan Yao, Y. D.
Issue Date:	2006
Relation:	Magnetics, IEEE Transactions 43(2) , 894-896 (2006)
URI:	http://ir.sinica.edu.tw/handle/201000000A/45854
Appears in Collections:	物理研究所

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