http://ir.sinica.edu.tw/handle/201000000A/45778
Title: | Quantitative analysis of magnetization reversal in submicron S-patterned structures with narrow constrictions by magnetic force microscopy | Authors: | Chen, Y. C. Yao, Y. D. Lee, S. F. Liou, Y. Tsai, J. L. Lin, Y. A. |
Issue Date: | 2005-01-31 | Relation: | APPLIED PHYSICS LETTERS86((5): Art. No. 053111) | URI: | http://ir.sinica.edu.tw/handle/201000000A/45778 |
Appears in Collections: | 物理研究所 |
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