http://ir.sinica.edu.tw/handle/201000000A/44227
Title: | Detection of Styrene Impurities in Phenylacetylene by Resonance-Enhanced Multiphoton Ionization Time-of-Flight Mass Spectrometry | Authors: | Tzeng, W. B. Narayanan, K. Lin, J. L. |
Issue Date: | 1999 | Relation: | Appl. Spectrosc. 53, 731-734 | URI: | http://ir.sinica.edu.tw/handle/201000000A/44227 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-7028&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
Appears in Collections: | 原子與分子科學研究所 |
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