Electronic and Atomic Structures of Si–C–N Thin Film by X-ray-absorption Spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/44066

Title:	Electronic and Atomic Structures of Si–C–N Thin Film by X-ray-absorption Spectroscopy
Authors:	Pong, W. F. Chang, Y. K. Hsieh, H. H. Tsai, M. H. Lee, K. H. Dann, T. E. Chien, F. Z. Tseng, P. K. Tsang, K. L. Su, W. K. Chen, L. C. Wei, S. L. Chen, K. H. Bhusari, D. M. Chen, Y. F.
Issue Date:	1998
Relation:	JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 92, 115-118
URI:	http://ir.sinica.edu.tw/handle/201000000A/44066
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0368-2048&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	原子與分子科學研究所

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