Electronic and bonding structures of amorphous Si-C-N thin films by X-ray-absorption spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/44026

Title:	Electronic and bonding structures of amorphous Si-C-N thin films by X-ray-absorption spectroscopy
Authors:	Tsai, H. M. Jan, J. C. Chiou, J. W. Pong, W. F. Tsai, M.-H. Chang, Y. K. Chen, Y. Y. Yang, Y. W. Lai, L. J. Wu, J. J. Wu, C. T. Chen, K. H. Chen, L. C.
Issue Date:	2001
Relation:	APPLIED PHYSICS LETTERS 79, 2393-2395
URI:	http://ir.sinica.edu.tw/handle/201000000A/44026
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-6951&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	原子與分子科學研究所

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