Nanometer-resolution distance measurement with a noninterferometric method

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/43458

Title:	Nanometer-resolution distance measurement with a noninterferometric method
Authors:	Deng, Kung-Li Wang, Jyhpyng
Issue Date:	1994-01-01
Relation:	APPLIED OPTICS 33(1), 113-116
URI:	http://ir.sinica.edu.tw/handle/201000000A/43458
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1559-128X&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	原子與分子科學研究所

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