http://ir.sinica.edu.tw/handle/201000000A/42514
Title: | Eliminating the effects of local surface properties on the linearity of optical profilometry by a double-scan method | Authors: | Tsai, Chao-Wei Lee, Chau-Hwang Wang, Jyhpyng |
Issue Date: | 1998-12-01 | Conference: | International Photonics Conference (Taipei, Taiwan) | URI: | http://ir.sinica.edu.tw/handle/201000000A/42514 |
Appears in Collections: | 原子與分子科學研究所 |
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