http://ir.sinica.edu.tw/handle/201000000A/41663
Title: | Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products | Authors: | Peng, C. Y. Tseng, S. T. |
Issue Date: | 2010-03-01 | Relation: | IEEE Transactions on Reliability 59(1), 30-37 | URI: | http://ir.sinica.edu.tw/handle/201000000A/41663 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0018-9529&DestApp=JCR&RQ=IF_CAT_BOXPLOT | URL: | http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5418918&abstractAccess=no&userType=inst |
Appears in Collections: | 統計科學研究所 |
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