An Efficient Fault Detection Algorithm for NAND Flash Memory

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/40395

Title:	An Efficient Fault Detection Algorithm for NAND Flash Memory
Authors:	Kuo, Tei-Wei Huang, Po-Chun Chang, Yuan-Hao Ko, Chia-Ling Hsueh, Chih-Wen
Issue Date:	2011-03-01
Relation:	ACM SIGAPP Applied Computing Review 11, 8-16
URI:	http://ir.sinica.edu.tw/handle/201000000A/40395
Appears in Collections:	資訊科學研究所

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