The Investigation of Edge Leakage Currents of Graphene Transistors

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/34568

Title:	The Investigation of Edge Leakage Currents of Graphene Transistors
Authors:	Lin, Meng-Yu Chen, Yen-Hao Lee, Si-Chen Lin, Shih-Yen
Issue Date:	2013-12-01
Conference:	OPTIC 2013 (Zhongli, Taiwan : National Central University)
URI:	http://ir.sinica.edu.tw/handle/201000000A/34568
Appears in Collections:	應用科學研究中心

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