Integration of Paper-based Microarray and Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) for Parallel Detection and Quantification of Molecules in Multiple Samples Automatically

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/34337

Title:	Integration of Paper-based Microarray and Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) for Parallel Detection and Quantification of Molecules in Multiple Samples Automatically
Authors:	Kuo-Jui Chu Po-Chun Chen Yun-Wen You Hsun-Yun Chang Wei-Lun Kao Yi-Hsuan Chu Chen-Yi Wu Jing-Jong Shyue
Issue Date:	2018-04
Relation:	ANALYTICA CHIMICA ACTA 1005, 61-69
URI:	http://ir.sinica.edu.tw/handle/201000000A/34337
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2670&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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