Dual-Cut Graphene Transistors with Constant-Current Regions Fabricated by the Atomic Force Microscope Anode Oxidation

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/34288

Title:	Dual-Cut Graphene Transistors with Constant-Current Regions Fabricated by the Atomic Force Microscope Anode Oxidation
Authors:	C.-R. Wu K. P. Dou C.-H. Wang C.-E. Chang C.-C. Kaun C.-H. Wu S.-Y. Lin
Issue Date:	2017-01
Relation:	Japanese Journal of Applied Physics 56, 010307
URI:	http://ir.sinica.edu.tw/handle/201000000A/34288
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0021-4922&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://iopscience.iop.org/article/10.7567/JJAP.56.010307/meta;jsessionid=0799192B2BCE24F9E2D3DD2E01AFB19A.ip-10-40-1-114
Appears in Collections:	應用科學研究中心

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