Using optical profilometry to characterize cell membrane roughness influenced by Amyloid-beta conformers and electric fields

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33845

Title:	Using optical profilometry to characterize cell membrane roughness influenced by Amyloid-beta conformers and electric fields
Authors:	Pan, H. -J. Wang, R. -L. Xiao, J. -L. Chang, Y. -J. Cheng, J. -Y. Chen, Y. -R. Lee, C. -H.
Relation:	JOURNAL OF BIOMEDICAL OPTICS
URI:	http://ir.sinica.edu.tw/handle/201000000A/33845
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1083-3668&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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