Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33334

Title:	Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
Authors:	Hsu, S. H. Liu, E. S. Chang, Y. C. Hilfiker, J. N. Kim, Y. D. Kim, T. J. Lin, C. J. Lin, G. R.
Issue Date:	2008
Relation:	PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 876-9
URI:	http://ir.sinica.edu.tw/handle/201000000A/33334
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1862-6300&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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