Molecular Dynamic-Secondary Ion Mass Spectrometry (D-SIMS) Ionized by C60+-Ar+ Co-Sputtering

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33116

Title:	Molecular Dynamic-Secondary Ion Mass Spectrometry (D-SIMS) Ionized by C60+-Ar+ Co-Sputtering
Authors:	You, Yun-Wen Chang, Hsun-Yun Lin, Wei-Chun Kuo, Che-Hung Lee, Szu-Hsian Kao, Wei-Lun Yen, Guo-Ji Chang, Chi-Jen Liu, Chi-Ping Huang, Chih-Chieh Liao, Hua-Yang Shyue, Jing-Jong
Issue Date:	2011
Relation:	Rapid Communications in Mass Spectrometry 25 [19] 2897-2904 (2011)
URI:	http://ir.sinica.edu.tw/handle/201000000A/33116
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0951-4198&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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