http://ir.sinica.edu.tw/handle/201000000A/33097
題名: | Effect of Fabrication Parameters on Three-Dimensional Nanostructures of Bulk-Heterojunctions Imaged by High-Resolution Scanning ToF-SIMS | 作者: | Yu, Bang-Ying Lin, Wei-Chun Wang, Wei-Ben Iida, Shin-ichi Chen, Sun-Zen Liu, Chia-Yi Kuo, Che-Hung Lee, Szu-Hsian Kao, Wei-Lun Yen, Guo-Ji You, Yun-Wen Liu, Chi-Ping Jou, Jwo-Huei Shyue, Jing-Jong |
公開日期: | 2010 | 關聯: | ACS Nano 4 [4] 833-840 | URI: | http://ir.sinica.edu.tw/handle/201000000A/33097 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1936-0851&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
顯示於: | 應用科學研究中心 |
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