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Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link | |
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1 | 2015 | Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope | Lin, Huiting; Wu, Sing-Lin; Wang, Ji-Wun; Chen, Tse-Jun ; Wang, Ming-Jye ; Chen, Jeng-Chung; Wu, Maw-Kuen ; Chi, Cheng-Chung | SUPERCONDUCTOR SCIENCE & TECHNOLOGY 28(8), 085006 |