| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
| 2012 | Exchange bias in sputtered FM/BiFeO3 thin films | Chang, H. W.; Yuan, F. T.; Shih, C. W; Li, W. L.; Chen, P. H.; Chang, W. C.; Jen, S. U. | JOURNAL OF APPLIED PHYSICS111, 07B105-107 | | | |
| 2006 | Improvement of energy product in exchange coupled Fe49−xCoxPt51 (x=0.0,0.7,1.3,2.2) thin films | Yuan, F. T.; Hsiao, S. N.; Liao, W. M.; Chen, S. K.; Yao, Y. D. | Journal of Applied Physics 99(8), 08E915 | | | |
| 2007 | Magnetic properties and microstructure of ultrathin Co/Si(111) films | Chang, H. W.; Tsay, J. S.; Hung, Y. C.; Yuan, F. T.; Chan, W. Y.; Su, W. B.; Chang, C. S.; Yao, Y. D. | Journal of Applied Physics101, 09D124 | | | |
| 2008 | Magnetization reversal and microstructure of FePt-Ag(001) particulate thin films for perpendicular magnetic recording media | Wei, D. H.; Yuan, F. T.; Chang, H. W.; You, K. L.; Liou, Y.; Yao, Y. D.; Wu, J. K. | Journal of Applied Physics103, 07E116 | | | |
| 2006 | Ordering Enhancement of FePt Thin Films by Introducing Mo layers | Hsiao, S. N.; Chen, S. K.; Yuan, F. T.; Huang, H. W.; Hsu, C. W.; Yao, Y. D.; Lee, H. Y. | Magnetics, IEEE Transactions 43(2) , 870-872 (2006) | | | |
| 2007 | Self-organized magnetic assemblies of (001) oriented FePt nanoparticles with SiO2 additive | Wei, D. H.; Yuan, F. T.; Chang, H. W.; You, K. L.; Liou, Y.; Chin, T. S.; Yu, C. C.; Yao, Y. D. | Nanotechnology18, 335603 | | | |
| 2012 | Sputter-prepared BiFeO(001) films on L1o FePt(001)/glass substrates | Chang, H. W.; Yuan, F. T.; Shih, C. W.; Wang, C. R.; Chang, W. C.; Jen, S. U. | JOURNAL OF APPLIED PHYSICS111, 07D918-920 | | | |
| 2006 | Step edge growth of Co nanoislands on Cu(111) surface | Chang, H. W.; Yuan, F. T.; Yao, Y. D.; Cheng, W. Y.; Su, W. B.; Chang, C. S.; Lee, C. W.; Cheng, W. C. | Journal of Applied Physics100, 32767 | | | |
| 2006 | Step edge growth of Co nanoislands on Cu(111) surface | Chang, H. W.; Yuan, F. T.; Yao, Y. D.; Cheng, W. Y.; Su, W. B.; Chang, C. S.; Lee, C. W.; Cheng, W. C. | Journal of Applied Physics 100(8), 084304 | | | |
