Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2008 | Nanoscale doping fluctuation resolved by electrostatic force microscopy via the effect of surface band bending | Chin, Shu-Cheng; Chang, Yuan-Chih; Chang, Chia-Seng; Woon, Wei-Yen; Lin, Li-Te; Tao, Hung-Jan | Applied Physics Letters93, 253102 | |||
2008 | Two-dimensional dopant profiling by electrostatic force microscopy using carbon nanotube modified cantilevers | Chin, Shu-Cheng; Chang, Yuan-Chih ; Hsu, Chen-Chih; Lin, Wei-Hsiang; Wu, Chih-I; Chang, Chia-Seng ; Tsong, Tien T.; Woon, Wei-Yen; Lin, Li-Te; Tao, Hung-Jan | Nanotechnology 19, 325703 |