Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2012 | Exchange bias in sputtered FM/BiFeO3 thin films | Chang, H. W.; Yuan, F. T.; Shih, C. W; Li, W. L.; Chen, P. H.; Chang, W. C.; Jen, S. U. | JOURNAL OF APPLIED PHYSICS111, 07B105-107 |