| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
| 1998 | Analysis of ellipsometric and photoemission spectra of diluted magnetic semiconductors by hybridization interaction mechanism | Kim, Y. D.; Chang, Y. C.; Klein, M. V. | THIN SOLID FILMS 313-314, 183 | | | |
| 2008 | Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling | Hsu, S. H.; Liu, E. S.; Chang, Y. C.; Hilfiker, J. N.; Kim, Y. D.; Kim, T. J.; Lin, C. J.; Lin, G. R. | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 876-9 | | | |
| 2007 | Dielectric functions and electronic structure of InAs_{x}P_{1-x }films on InP | Choi, S. G.; Palmstrøm, C. J.; Kim, Y. D.; Aspnes, D. E.; Kim, H.; Chang, Y. C. | APPLIED PHYSICS LETTERS 91, 041917 | | | |
| 2010 | Dielectric functions and interband transitions of In1−xAlxSb alloys | Yoon, J. J.; Kim, T. J.; Jung, Y. W.; Aspnes, D. E.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Shin, S. H.; Song, J. D. | Appl. Phys. Lett. 97, 111902 | | | |
| 2008 | Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters | Choi, S. G.; Aspnes, D. E.; Stoute, N. A.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Palmstrøm, C. J. | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 884-7 | | | |
| 2009 | Dielectric response of AlSb from 0.7 to 5.0 eV determined by in situ ellipsometry | Jung, Y. W.; Ghong, T. H.; Byun, J. S.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Shin, S. H.; Song, J. D. | Appl. Phys. Lett. 94, 231913-231915 | | | |
| 1993 | Effect of d Electrons in Transition-metal Ions on Band Gap Energies of Diluted Magnetic Semiconductors | Kim, Y. D.; Chang, Y. C.; Klein, M. V. | PHYSICAL REVIEW B 48, 17770 | | | |
| 2010 | InAs critical-point energies at 22 K from spectroscopic ellipsometry | Kim, T. J.; Yoon, J. J.; Hwang, S. Y.; Jung, Y. W.; Ghong, T. H.; Kim, Y. D.; Kim, H. J.; Chang, Y. -C. | Appl. Phys. Lett. 97, 171912 | | | |
| 2009 | Interband transitions of InAsxSb1−x alloy films | Kim, T. J.; Yoon, J. J.; Hwang, S. Y.; Aspnes, D. E.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Song, J. D. | Appl. Phys. Lett. 95, 111902-4 | | | |
| 2010 | Optical metrology of randomly-distributed Au colloids on a multilayer film | Hsu, S. -H.; Chang, Y. -C.; Chen, Y. -C.; Wei, P. -K.; Kim, Y. D. | Optics Express 18, 1310-1315 | | | |
| 2008 | Optical nanometrology of Au nanoparticles on a multilayer film | Chang, Y. C.; Hsu, S. H.; Kim, Y. D. | Phys. Stat. Sol.(c) 5, 1194-7 | | | |
| 2008 | Optical Properties of GaN by Using Ellipsometry and a Band Calculation | Kim, T. J.; Byun, J. S.; Kim, Y. D.; Kim, H.; Chang, Y-C | J. Korean Phys. Soc. 53, 1575-1579 | | | |
| 1994 | Optical Properties of the Zincblende CdSe and ZnxCd1-xSe films grown on GaAs | Kim, Y. D.; Klein, M. V.; Ren, S. F.; Chang, Y. C.; Luo, H.; Samarth, N.; Furdyna, J. K. | PHYSICAL REVIEW B 49, 7262 | | | |
