| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2011 | Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties | Liao, H. -S.; Juang, B. -J.; Chang, W. -C.; Lai, W. -C.; Huang, K. -Y.; Chang, C. -S. | REVIEW OF SCIENTIFIC INSTRUMENTS82, 113710 | |||
| 2012 | Spring Constant Calibration of Microcantilever by Astigmatic Detection System | Liao, H. -S; Juang, B. -J.; Huang, K. -Y.; Hwu, E. -T.; Chang, C. -S. | JAPANESE JOURNAL OF APPLIED PHYSICS51,05KB13 |
