| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2006 | Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy | C.L. Dong; K. Asokan; C.L. Chang; C.L. Chen; P.C. Lee; P.C. Chen; Y.Y. Chen; J.F. Lee; J.-H. Guo | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 152, 1-5 |
