Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2018 | Hot-Spot Suppression for Resource-Constrained Image Recognition Devices with Non-Volatile Memory | Chun-Feng Wu; Ming-Chang Yang; Yuan-Hao Chang; Tei-Wei Kuo | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 37(11), 2567-2577 | |||
2018 | Hot-Spot Suppression for Resource-Constrained Image Recognition Devices with Non-Volatile Memory | Chun-Feng Wu; Ming-Chang Yang; Yuan-Hao Chang; Tei-Wei Kuo | ||||
2016 | How to Enable Software Isolation and Boost System Performance with Sub-block Erase over 3D Flash Memory | Hsin-Yu Chang; Chien-Chung Ho; Yuan-Hao Chang; Yu-Ming Chang; Tei-Wei Kuo | ||||
2015 | How to Improve the Space Utilization of Dedup-based PCM Storage Devices | Chun-Ta Lin; Yuan-Hao Chang; Tei-Wei Kuo; Hung-Sheng Chang; Hsiang-Pang Li | ||||
2018 | Impact of Memory Frequency Scaling on User-centric Smartphone Workloads | Hashan Roshantha Mendis; Wei-Ming Chen; Leandro Indrusiak; Tei-Wei Kuo; Pi-Cheng Hsiu | ||||
2010 | Improving Flash Wear-Leveling by Proactively Moving Static Data | Yuan-Hao Chang; Jen-Wei Hsieh; Tei-Wei Kuo | IEEE Transactions on Computers (TC) 59(1), 53-65 | |||
2016 | Improving PCM Endurance with a Constant-cost Wear Leveling Design | Yu-Ming Chang; Pi-Cheng Hsiu; Yuan-Hao Chang; Chi-Hao Chen; Tei-Wei Kuo; Cheng-Yuan Michael Wang | ACM Transactions on Design Automation of Electronic Systems (TODAES) 22(1), 9:1-9:27 | |||
2016 | Many-Core Real-Time Task Scheduling with Scratchpad Memory | Sheng-Wei Cheng; Che-Wei Chang; Jian-Jia Chen; Tei-Wei Kuo; Pi-Cheng Hsiu | IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS 27(10):2953-2966 | |||
2015 | Marching-based Wear Leveling for PCM-based Storage Systems | Hung-Sheng Chang; Yuan-Hao Chang; Pi-Cheng Hsiu; Tei-Wei Kuo; Hsiang-Pang Li | ACM Transactions on Design Automation of Electronic Systems (TODAES) 20(2), 25:1-25:22 | |||
2019 | On Improving the Write Responsiveness for Host-Aware SMR Drives | Ming-Chang Yang; Yuan-Hao Chang ; Fenggang Wu; Tei-Wei Kuo; David Hung-Chang Du | IEEE Transactions on Computers (TC) 68(1), 111-124 | |||
2015 | On Relaxing Page Program Disturbance over 3D MLC Flash Memory | Yu-Ming Chang; Yung-Chun Li; Yuan-Hao Chang; Tei-Wei Kuo; Chih-Chang Hsieh; Hsiang-Pang Li | ||||
2014 | On Trading Wear-leveling with Heal-leveling | Yu-Ming Chang; Yuan-Hao Chang; Jian-Jia Chen; Tei-Wei Kuo; Hsiang-Pang Li; Hang-Ting Lue | ||||
2016 | Pattern-Aware Write-Back Strategy to Minimize Energy Consumption of PCM-based Storage Systems | Hung-Sheng Chang; Yuan-Hao Chang; Yuan-Hung Kuan; Xiang-Zhi Huang; Tei-Wei Kuo; Hsiang-Pang Li | ||||
2018 | Proactive Channel Adjustment to Improve Polar Code Capability for Flash Storage Devices | Kun-Cheng Hsu; Che-Wei Tsao; Yuan-Hao Chang; Tei-Wei Kuo; Yu-Ming Huang | ||||
2018 | Real-Time Computing and the Evolution of Embedded System Designs | Tei-Wei Kuo; Jian-Jia Chen; Yuan-Hao Chang; Pi-Cheng Hsiu | ||||
2016 | Reducing Data Migration Overheads of Flash Wear Leveling in a Progressive Way | Ming-Chang Yang; Yuan-Hao Chang; Tei-Wei Kuo; Fu-Hsin Chen | IEEE Transactions on Very Large Scale Integration Systems (TVLSI) 24(5), 1808-1820 | |||
2013 | Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design | Yuan-Hao Chang; Po-Chun Huang; Pei-Han Hsu; Lue-Jane Lee; Tei-Wei Kuo; David Hung-Chang Du | IEEE Transactions on Computers (TC) 62(12), 2503-2515 | |||
2015 | Reliability-Aware Striping with Minimized Performance Overheads for Flash-based Storage Devices | Ming-Chang Yang; Yu-Ming Chang; Po-Chun Huang; Yuan-Hao Chang; Lue-Jane Lee; Tei-Wei Kuo | ||||
2015 | Rethinking I/O Request Management over eMMC-based Solid-State Drives | Che-Wei Tsao; Chun-Yi Liu; Chien-Chung Ho; Tse-Yuan Wang; Po-Chun Huang; Yuan-Hao Chang; Tei-Wei Kuo | ||||
2018 | Scrubbing-aware Secure Deletion for 3D NAND Flash | Wei-Chen Wang; Chien-Chung Ho; Yuan-Hao Chang; Tei-Wei Kuo; Ping-Hsien Lin | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 37(11), 2790-2801 |