Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
2018 | Degradation Analysis with Measurement Errors | Peng, C. Y.; Ai, H. F. | Proceedings of the 2nd Pacific Rim Statistical Conference for Production Engineering (Springer) | | | |
2018 | Discussion | Peng, C. Y. | ANNALS OF THE INSTITUTE OF STATISTICAL MATHEMATICS 70(2), 269-274 | | | |
2013 | Estimation for Weibull Distribution with Type II Highly Censored Data | Yu, H. F.; Peng, C. Y. | Quality Technology and Quantitative Management 10(2), 193-202 | | | |
2006 | Fabrication of an ordered nanoparticle array with a nanoaperture membrance used as a contact-mask | Lin, M. N.; Lin, M. T.; Liu, C. Y.; Lai, M. Y.; Liu, N. W.; Peng, C. Y.; Wang, H. H.; Wang, Y. L. | NANOTECHNOLOGY 17, 315-319 | | | |
2005 | Fabrication of Anodic Alumina Film with Custom-Designed Arrays of Nanochannels. | Liu, N. W.; Datta, A.; Liu, C. Y.; Peng, C. Y.; Wang, H. H.; Wang, Y. L. | ADVANCED MATERIALS 17, 222-225 | | | |
2005 | Ideally Ordered 10 nm Channel Arrays Grown by Anodization of Focused-Ion-Beam Patterned Aluminum. | Peng, C. Y.; Liu, C. Y.; Liu, N. W.; Wang, H. H.; Datta, A.; Wang, Y. L. | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B B23, 559-562 | | | |
2007 | Improved broadband and quasi-omnidirectional anti-reflection properties with biomimetic silicon nanostructures | Huang, Y. F.; Chattopadhyay, S.; Jen, Y. J.; Peng, C. Y.; Liu, T. A.; Hsu, Y. K.; Pan, C. L.; Lo, H. C.; Hsu, C. H.; Chang, Y. H.; Lee, C. S.; Chen, K. H.; Chen, L. C. | NATUER NANOTECHNOLOGY 2, 770-774 | | | |
2012 | Integrated Degradation Models in R Using iDEMO | Cheng, Y. S.; Peng, C. Y. | Journal of Statistical Software 49(2), 1-22 | | | |
2005 | Long-Range Ordered Nanoaperture Array with Uniform Diameter and Interpore Spacing. | Lin, M. N.; Lin, M. T.; Liu, C. Y.; Lai, M. Y.; Liu, N. W.; Peng, C. Y.; Wang, H. H.; Wang, Y. L. | APPLIED PHYSICS LETTERS 87, 173116 | | | |
- | Measurement errors in degradation analysis | Peng, C. Y.; Ai, H. F. | | | | |
2009 | Mis-specification Analysis of Linear Degradation Models | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability 58(3), 444-455 | | | |
2013 | On the Choice of Nugget in Kriging Modeling for Deterministic Computer Experiments | Peng, C. Y.; Wu, C. F. Jeff | Journal of Computational and Graphical Statistics | | | |
- | Optimal Classification Policies and Comparisons for Highly Reliable Products | Peng, C. Y. | Optimal Classification Policies and Comparisons for Highly Reliable Products | | | |
2015 | Optimal classification policy and comparisons for highly reliable products | Peng, C. Y. | Sankhya B 77(2), 321-358 | | | |
2004 | Order-Disorder Transition of Anodic Alumina Nanochannel Arrays Grown under the Guidance of Focused-Ion-Beam Patterning. | Liu, C. Y.; Datta, A.; Liu, N. W.; Peng, C. Y.; Wang, Y. L. | APPLIED PHYSICS LETTERS 84, 2509-2511 | | | |
2022 | Particulate matters, aldehydes, and polycyclic aromatic hydrocarbons produced from deep-frying emissions: comparisons of three cooking oils with distinct fatty acid profiles | Chiang, K. M.; Xiu, L. L.; Peng, C. Y.; Lung, S. C. C. ; Chen, Y. C.; Pan, W. H. | npj Science of Food 6(1), 28 | | | |
2010 | Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability 59(1), 30-37 | | | |
2013 | Statistical Lifetime Inference with Skew-Wiener Linear Degradation Models | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability | | | |
2015 | Threshold degradation in R using iDEMO | Peng, C. Y.; Cheng, Y. S. | Computational Network Analysis with R (New York : John Wiley & Sons) | | | |