Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2010 | Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability 59(1), 30-37 | |||
2013 | Statistical Lifetime Inference with Skew-Wiener Linear Degradation Models | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability | |||
2015 | Threshold degradation in R using iDEMO | Peng, C. Y.; Cheng, Y. S. | Computational Network Analysis with R (New York : John Wiley & Sons) |