Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2000 | Structural Characterization of Surface Hexatic Behavior in Free-Standing 4O.8 Liquid-Crystal Films | Chao, C. Y.; Pan, T. C.; Chou, C. F.; Ho, J. T. | PHYSICAL REVIEW E62 (2): R1485-R1488 |