Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2009 | The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors | Chou, S. T.; Lin, S. Y.; Yu, Bonnie; Shyue, J. J.; Tseng, C. C.; Chen, C. N.; Wu, M. C.; Lin, W. | Thin Solid Films vol. 517, no. 5, pp. 1799–1802 |