公開日期 | 題名 | 作者 | 關聯 | scopus | WOS | 全文 |
2012 | Integrated Degradation Models in R Using iDEMO | Cheng, Y. S.; Peng, C. Y. | Journal of Statistical Software 49(2), 1-22 | | | |
2015 | Inverse Gaussian Processes with Random Effects and Explanatory Variables for Degradation Data | Peng, C. Y. | Technometrics 57(1), 100-111 | | | |
2009 | Mis-specification Analysis of Linear Degradation Models | Peng, C. Y. ; Tseng, S. T. | IEEE Transactions on Reliability 58(3), 444-455 | | | |
2013 | On the Choice of Nugget in Kriging Modeling for Deterministic Computer Experiments | Peng, C. Y. ; Wu, C. F. Jeff | Journal of Computational and Graphical Statistics | | | |
2022 | Optimum Test Planning for Heterogeneous Inverse Gaussian Processes | Peng, C. Y. ; Nagatsuka, H.; Cheng, Y. S. | Lifetime Data Analysis 28, 401-427 | | | |
2021 | Profile Optimum Planning for Degradation Analysis | Peng, C. Y. ; Cheng, Y. S. | Naval Research Logistics (NRL) 68(7), 951-962 | | | |
2010 | Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products | Peng, C. Y. ; Tseng, S. T. | IEEE Transactions on Reliability 59(1), 30-37 | | | |
2013 | Statistical Lifetime Inference with Skew-Wiener Linear Degradation Models | Peng, C. Y. ; Tseng, S. T. | IEEE Transactions on Reliability | | | |
2019 | Student-t Processes for Degradation Analysis | Peng, C. Y. ; Cheng, Y. S. | TECHNOMETRICS 62(2), 223-235 | | | |
2023 | The First-Passage-Time Moments for the Hougaard Process and its Birnbaum-Saunders Approximation | Peng, C. Y. ; Dong, Y. S.; Fan, T. H. | STATISTICS AND COMPUTING 33, 59 | | | |
2017 | Threshold Degradation | Peng, C. Y. ; Cheng, Y. S. | | | | |
2015 | Threshold degradation in R using iDEMO | Peng, C. Y. ; Cheng, Y. S. | Computational Network Analysis with R (New York : John Wiley & Sons) | | | |