公開日期 | 題名 | 作者 | 關聯 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2009 | Mis-specification Analysis of Linear Degradation Models | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability 58(3), 444-455 | |||
2010 | Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability 59(1), 30-37 | |||
2013 | Statistical Lifetime Inference with Skew-Wiener Linear Degradation Models | Peng, C. Y.; Tseng, S. T. | IEEE Transactions on Reliability |