| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2009 | Mis-specification Analysis of Linear Degradation Models | Peng, C. Y. ; Tseng, S. T. | IEEE Transactions on Reliability 58(3), 444-455 | |||
| 2010 | Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products | Peng, C. Y. ; Tseng, S. T. | IEEE Transactions on Reliability 59(1), 30-37 | |||
| 2013 | Statistical Lifetime Inference with Skew-Wiener Linear Degradation Models | Peng, C. Y. ; Tseng, S. T. | IEEE Transactions on Reliability |
