| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2009 | Study of Charge Diffusion at the Carbon Nanotube-SiO2 Interface by Electrostatic Force Microscopy | Y He; H G Ong; Y Zhao; S He; L-J Li; J L Wang | JOURNAL OF PHYSICAL CHEMISTRY C 113, 15476 |
