| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2015 | Determination of the London penetration depth of FeSe0.3Te0.7 thin films by scanning SQUID microscope | Lin, Huiting; Wu, Sing-Lin; Wang, Ji-Wun; Chen, Tse-Jun ; Wang, Ming-Jye ; Chen, Jeng-Chung; Wu, Maw-Kuen ; Chi, Cheng-Chung | SUPERCONDUCTOR SCIENCE & TECHNOLOGY 28(8), 085006 |
