Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2014 | Nondestructive characterization of the structural quality and thickness of large-area graphene on various substrates | Y.L. Liu; C.C. Yu; K.T. Lin; E.Y. Wang; T.C. Yang; H.L. Chen; C.W. Chen; C.K. Chang; L.C. Chen; K.H. Chen | ANALYTICAL CHEMISTRY 86, 7192 |