Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2021 | Evolution of the Electronic Properties of ZrX2 (X = S, Se, or Te) Thin Films under Varying Thickness | Rovi Angelo B. Villaos; Harvey N. Cruzado; John Symon C. Dizon; Aniceto B. Maghirang III; Zhi-Quan Huang; Chia-Hsiu Hsu; Shin-Ming Huang; Hsin Lin ; Feng-Chuan Chuang | The Journal of Physical Chemistry C 125(1), 1134-1142 |